FREQUENTLY ASKED QUESTIONS ABOUT ATOMIC FORCE MICROSCOPY (AFM FAQ)

AFM Artifacts

by Peter Eaton

1. Tip Artifacts

Blunt Tip

This artifact is common after scanning for a long time with the same tip. Tips may last very long, or sometimes go blunt quickly.
In order to find out if your tip is blunt, scan a well-known sample like this one.



In the example above, the image on the right is made with a blunt tip, the left with a sharp (new) one.

How to avoid it.
Use your tips carefully! If it gets blunt, replace it!

Artifacts Index Page


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This document was written by, and is maintained by Peter Eaton (peter.eaton@fc.up.pt)
Reproduction or distribution not allowed without my permission.
Please feel free to email me comments / questions / answers.
Document updated on 14th September 2007.